Low temperature test chamber low temperature damage to products

Low temperature in nature will cause product failure. If the product is not subjected to low temperature test before leaving the factory, it may cause brittleness and hardening of the material. The parts caused by different shrinkage of different materials will kill each other, and the constrained glass will cause static fatigue. Transistor Capacitor Transformer performance changes, water condensation and icing, and reduced lubrication performance.

During the Second World War, German tanks could not be started on the battlefield of Sude due to low temperatures, and they could not resist the assault launched by the Soviets in the early morning, which made the march into trouble. On the Korean battlefield, the low temperature caused the failure of electronic equipment in the US military's electronic detection system to reach 80%, which made the US military's operational command system malfunction.

YASELINE low temperature test chamber is suitable for testing various performance indexes of products in low temperature environment.

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Modern life, more or less have to deal with cards, such as all kinds of IC cards, bank cards, supermarket cards, shopping cards, membership cards. Card package style so many cards are not easy to store, easy to appear chaos, often bring a lot of unnecessary trouble, card package is in order to manage so many cards and appear, can be said to be the product of modern economy. In addition to managing various cards more conveniently and quickly, card packs also have the function of radiation protection, so as to avoid the inconvenience caused by degaussing cards.

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